Y. C. Chou, D. Leung, I. Smorchkova, M. Wojtowicz, R. Grundbacher, L. Callejo, Q. Kan, R. Lai, P. H. Liu, D. Eng. Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting. Microelectronics Reliability, 44(7):1033-1038, 2004. [doi]
@article{ChouLSWGCKLLE04,
title = {Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting},
author = {Y. C. Chou and D. Leung and I. Smorchkova and M. Wojtowicz and R. Grundbacher and L. Callejo and Q. Kan and R. Lai and P. H. Liu and D. Eng},
year = {2004},
doi = {10.1016/j.microrel.2004.03.008},
url = {http://dx.doi.org/10.1016/j.microrel.2004.03.008},
tags = {C++},
researchr = {https://researchr.org/publication/ChouLSWGCKLLE04},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {44},
number = {7},
pages = {1033-1038},
}