Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting

Y. C. Chou, D. Leung, I. Smorchkova, M. Wojtowicz, R. Grundbacher, L. Callejo, Q. Kan, R. Lai, P. H. Liu, D. Eng. Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting. Microelectronics Reliability, 44(7):1033-1038, 2004. [doi]

Abstract

Abstract is missing.