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A Novel Data Recovery Technique for 3D TLC NAND Flash Memory Using Intercell Program

Y. L. Chou, W. J. Tsai, G. W. Wu, W. Chang, T. C. Lu, K.-C. Chen, C. Y. Lu. A Novel Data Recovery Technique for 3D TLC NAND Flash Memory Using Intercell Program. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-4, IEEE, 2023. [doi]

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Y. L. Chou

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W. J. Tsai

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G. W. Wu

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W. Chang

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T. C. Lu

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K.-C. Chen

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C. Y. Lu

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