A Novel Data Recovery Technique for 3D TLC NAND Flash Memory Using Intercell Program

Y. L. Chou, W. J. Tsai, G. W. Wu, W. Chang, T. C. Lu, K.-C. Chen, C. Y. Lu. A Novel Data Recovery Technique for 3D TLC NAND Flash Memory Using Intercell Program. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-4, IEEE, 2023. [doi]

@inproceedings{ChouTWCLCL23,
  title = {A Novel Data Recovery Technique for 3D TLC NAND Flash Memory Using Intercell Program},
  author = {Y. L. Chou and W. J. Tsai and G. W. Wu and W. Chang and T. C. Lu and K.-C. Chen and C. Y. Lu},
  year = {2023},
  doi = {10.1109/IRPS48203.2023.10117734},
  url = {https://doi.org/10.1109/IRPS48203.2023.10117734},
  researchr = {https://researchr.org/publication/ChouTWCLCL23},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023},
  publisher = {IEEE},
  isbn = {978-1-6654-5672-2},
}