Y. L. Chou, W. J. Tsai, G. W. Wu, W. Chang, T. C. Lu, K.-C. Chen, C. Y. Lu. A Novel Data Recovery Technique for 3D TLC NAND Flash Memory Using Intercell Program. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-4, IEEE, 2023. [doi]
@inproceedings{ChouTWCLCL23, title = {A Novel Data Recovery Technique for 3D TLC NAND Flash Memory Using Intercell Program}, author = {Y. L. Chou and W. J. Tsai and G. W. Wu and W. Chang and T. C. Lu and K.-C. Chen and C. Y. Lu}, year = {2023}, doi = {10.1109/IRPS48203.2023.10117734}, url = {https://doi.org/10.1109/IRPS48203.2023.10117734}, researchr = {https://researchr.org/publication/ChouTWCLCL23}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023}, publisher = {IEEE}, isbn = {978-1-6654-5672-2}, }