Nilotpal Choudhury, Tarun Samadder, Ravi Tiwari, Huimei Zhou, Richard G. Southwick, Miaomiao Wang, Souvik Mahapatra. Analysis of Sheet Dimension (W, L) Dependence of NBTI in GAA-SNS FETs. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-8, IEEE, 2021. [doi]
Abstract is missing.