Nilotpal Choudhury, Uma Sharma, Huimei Zhou, Richard G. Southwick, Miaomiao Wang, Souvik Mahapatra. Analysis of BTI, SHE Induced BTI and HCD Under Full VG/VD Space in GAA Nano-Sheet N and P FETs. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{ChoudhurySZSWM20,
title = {Analysis of BTI, SHE Induced BTI and HCD Under Full VG/VD Space in GAA Nano-Sheet N and P FETs},
author = {Nilotpal Choudhury and Uma Sharma and Huimei Zhou and Richard G. Southwick and Miaomiao Wang and Souvik Mahapatra},
year = {2020},
doi = {10.1109/IRPS45951.2020.9128310},
url = {https://doi.org/10.1109/IRPS45951.2020.9128310},
researchr = {https://researchr.org/publication/ChoudhurySZSWM20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3199-3},
}