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Two-Pattern ∆IDDQ Test for Recycled IC Detection

Prattay Chowdhury, Ujjwal Guin, Adit D. Singh, Vishwani D. Agrawal. Two-Pattern ∆IDDQ Test for Recycled IC Detection. In 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems, VLSID 2019, Delhi, India, January 5-9, 2019. pages 82-87, IEEE, 2019. [doi]

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