Kyriakos Christou, Maria K. Michael, Spyros Tragoudas. Implicit Critical PDF Test Generation with Maximal Test Efficiency. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 50-58, IEEE Computer Society, 2006. [doi]
@inproceedings{ChristouMT06, title = {Implicit Critical PDF Test Generation with Maximal Test Efficiency}, author = {Kyriakos Christou and Maria K. Michael and Spyros Tragoudas}, year = {2006}, doi = {10.1109/DFT.2006.34}, url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.34}, tags = {testing}, researchr = {https://researchr.org/publication/ChristouMT06}, cites = {0}, citedby = {0}, pages = {50-58}, booktitle = {21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-2706-X}, }