Kyriakos Christou, Maria K. Michael, Spyros Tragoudas. Implicit Critical PDF Test Generation with Maximal Test Efficiency. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 50-58, IEEE Computer Society, 2006. [doi]
Abstract is missing.