Yu-Lin Chu, Hsi-Yu Kuo, Sheng-Fu Hsu, Yung-Sheng Tsai, Ming-Yi Wang, Chuan-Li Chang, Bill Kiang, Kenneth Wu. A new mechanism of signal path charging damage across separated power domain deep N-Well interface. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 6, IEEE, 2018. [doi]
Abstract is missing.