Robert Chun, Linda Yang. Reuse of Firmware Tests in System-On-Chip Design Verification. In Hamid R. Arabnia, Laurence Tianruo Yang, editors, Proceedings of the International Conference on VLSI, VLSI 03, June 23 - 26, 2003, Las Vegas, Nevada, USA. pages 70-78, CSREA Press, 2003.
Abstract is missing.