S. O. Churayev, B. T. Matkarimov, T. T. Paltashev. On-chip measurements of standard-cell propagation delay. In 2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010. pages 179-181, IEEE, 2010. [doi]
@inproceedings{ChurayevMP10,
title = {On-chip measurements of standard-cell propagation delay},
author = {S. O. Churayev and B. T. Matkarimov and T. T. Paltashev},
year = {2010},
doi = {10.1109/EWDTS.2010.5742113},
url = {http://doi.ieeecomputersociety.org/10.1109/EWDTS.2010.5742113},
researchr = {https://researchr.org/publication/ChurayevMP10},
cites = {0},
citedby = {0},
pages = {179-181},
booktitle = {2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010},
publisher = {IEEE},
isbn = {978-1-4244-9555-9},
}