S. O. Churayev, B. T. Matkarimov, T. T. Paltashev. On-chip measurements of standard-cell propagation delay. In 2010 East-West Design & Test Symposium, EWDTS 2010, St. Petersburg, Russia, September 17-20, 2010. pages 179-181, IEEE, 2010. [doi]
Abstract is missing.