Mauro Ciappa, Emre Ilgünsatiroglu, Alexey Yu. Illarionov. Monte Carlo simulation of emission site, angular and energy distributions of secondary electrons in silicon at low beam energies. Microelectronics Reliability, 52(9-10):2139-2143, 2012. [doi]
@article{CiappaII12,
title = {Monte Carlo simulation of emission site, angular and energy distributions of secondary electrons in silicon at low beam energies},
author = {Mauro Ciappa and Emre Ilgünsatiroglu and Alexey Yu. Illarionov},
year = {2012},
doi = {10.1016/j.microrel.2012.06.091},
url = {http://dx.doi.org/10.1016/j.microrel.2012.06.091},
researchr = {https://researchr.org/publication/CiappaII12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {9-10},
pages = {2139-2143},
}