M. Cimino, Hervé Lapuyade, M. De Matos, Thierry Taris, Yann Deval, Jean-Baptiste Begueret. A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications. J. Electronic Testing, 23(6):593-603, 2007. [doi]
@article{CiminoLMTDB07,
title = {A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications},
author = {M. Cimino and Hervé Lapuyade and M. De Matos and Thierry Taris and Yann Deval and Jean-Baptiste Begueret},
year = {2007},
doi = {10.1007/s10836-007-5025-3},
url = {http://dx.doi.org/10.1007/s10836-007-5025-3},
researchr = {https://researchr.org/publication/CiminoLMTDB07},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {23},
number = {6},
pages = {593-603},
}