Micro-prober for wafer-level low-noise measurements in MOS devices

Carmine Ciofi, Felice Crupi, Calogero Pace, Graziella Scandurra. Micro-prober for wafer-level low-noise measurements in MOS devices. IEEE T. Instrumentation and Measurement, 52(5):1533-1536, 2003. [doi]

Abstract

Abstract is missing.