Marcello Cioni, Patrick Fiorenza, Fabrizio Roccaforte, Mario Saggio, S. Cascino, A. Messina, Vincenzo Vinciguerra, Michele Calabretta, Alessandro Chini. Identification of Interface States responsible for VTH Hysteresis in packaged SiC MOSFETs. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 5, IEEE, 2022. [doi]
@inproceedings{CioniFRSCMVCC22,
title = {Identification of Interface States responsible for VTH Hysteresis in packaged SiC MOSFETs},
author = {Marcello Cioni and Patrick Fiorenza and Fabrizio Roccaforte and Mario Saggio and S. Cascino and A. Messina and Vincenzo Vinciguerra and Michele Calabretta and Alessandro Chini},
year = {2022},
doi = {10.1109/IRPS48227.2022.9764543},
url = {https://doi.org/10.1109/IRPS48227.2022.9764543},
researchr = {https://researchr.org/publication/CioniFRSCMVCC22},
cites = {0},
citedby = {0},
pages = {5},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7950-9},
}