Marcello Cioni, Patrick Fiorenza, Fabrizio Roccaforte, Mario Saggio, S. Cascino, A. Messina, Vincenzo Vinciguerra, Michele Calabretta, Alessandro Chini. Identification of Interface States responsible for VTH Hysteresis in packaged SiC MOSFETs. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 5, IEEE, 2022. [doi]
Abstract is missing.