Lawrence T. Clark, David Kidd, Vineet Agrawal, Samuel Leshner, Gokul Krishnan. Independent N and P process monitors for body bias based process corner correction. In Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014. pages 1-4, IEEE, 2014. [doi]
Abstract is missing.