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Semi-automated Assembly of a MEMS-Based Micro-scale CMM Probe and Future Optimization of the Process Chain with a View to Desktop Factory Automation

James D. Claverley, Arne Burisch, Richard K. Leach, Annika Raatz. Semi-automated Assembly of a MEMS-Based Micro-scale CMM Probe and Future Optimization of the Process Chain with a View to Desktop Factory Automation. In Svetan M. Ratchev, editor, Precision Assembly Technologies and Systems - 6th IFIP WG 5.5 International Precision Assembly Seminar, IPAS 2012, Chamonix, France, February 12-15, 2012. Proceedings. Volume 371 of IFIP Advances in Information and Communication Technology, pages 9-16, Springer, 2012. [doi]

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