Design and technology interaction beyond 32nm - researchr publication authors

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Michael Clinton, Clive Bittlestone, G. Girishankar, Viet Le, Vinod Menezes. Design and technology interaction beyond 32nm. In Rakesh Patel, Tom Andre, Aurangzeb Khan, editors, 2011 IEEE Custom Integrated Circuits Conference, CICC 2011, San Jose, CA, USA, Sept. 19-21, 2011. pages 1-9, IEEE, 2011. [doi]

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