Design and technology interaction beyond 32nm

Michael Clinton, Clive Bittlestone, G. Girishankar, Viet Le, Vinod Menezes. Design and technology interaction beyond 32nm. In Rakesh Patel, Tom Andre, Aurangzeb Khan, editors, 2011 IEEE Custom Integrated Circuits Conference, CICC 2011, San Jose, CA, USA, Sept. 19-21, 2011. pages 1-9, IEEE, 2011. [doi]

@inproceedings{ClintonBGLM11,
  title = {Design and technology interaction beyond 32nm},
  author = {Michael Clinton and Clive Bittlestone and G. Girishankar and Viet Le and Vinod Menezes},
  year = {2011},
  doi = {10.1109/CICC.2011.6055353},
  url = {http://dx.doi.org/10.1109/CICC.2011.6055353},
  researchr = {https://researchr.org/publication/ClintonBGLM11},
  cites = {0},
  citedby = {0},
  pages = {1-9},
  booktitle = {2011 IEEE Custom Integrated Circuits Conference, CICC 2011, San Jose, CA, USA, Sept. 19-21, 2011},
  editor = {Rakesh Patel and Tom Andre and Aurangzeb Khan},
  publisher = {IEEE},
  isbn = {978-1-4577-0222-8},
}