Ryan Cochran, Abdullah Nazma Nowroz, Sherief Reda. Post-silicon power characterization using thermal infrared emissions. In Vojin G. Oklobdzija, Barry Pangle, Naehyuck Chang, Naresh R. Shanbhag, Chris H. Kim, editors, Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010, Austin, Texas, USA, August 18-20, 2010. pages 331-336, ACM, 2010. [doi]
Abstract is missing.