A Multilevel DRAM with Hierarchical Bitlines and Serial Sensing

Bruce F. Cockburn, Jesús Hernández Tapia, Duncan G. Elliott. A Multilevel DRAM with Hierarchical Bitlines and Serial Sensing. In 11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA. pages 14-19, IEEE Computer Society, 2003. [doi]

Abstract

Abstract is missing.