Ronald Collett, Mike Gianfagna, Michel Courtoy, Martin Baynes, Johan Van Ginderdeuren, Kenneth L. McMillan, Stephen Ricca, Alberto L. Sangiovanni-Vincentelli, Steve Sapiro, Naeem Zafar. Panel: Complex System Verification: The Challenge Ahead. In DAC. pages 320, 1994. [doi]
Abstract is missing.