Randall S. Collica. A Logistic Regression Yield Model for SRAM Bit Fail Patterns. In Fabrizio Lombardi, Mariagiovanna Sami, Yvon Savaria, Renato Stefanelli, editors, The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings. pages 127-135, IEEE Computer Society, 1993.
Abstract is missing.