A programmable time measurement architecture for embedded memory characterization

Matthew Collins, Bashir M. Al-Hashimi, Neil Ross. A programmable time measurement architecture for embedded memory characterization. In 10th European Test Symposium (ETS 2005), May 22-25, 2005, Tallinn, Estonia. pages 128-133, IEEE, 2005. [doi]

Authors

Matthew Collins

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Bashir M. Al-Hashimi

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Neil Ross

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