A programmable time measurement architecture for embedded memory characterization

Matthew Collins, Bashir M. Al-Hashimi, Neil Ross. A programmable time measurement architecture for embedded memory characterization. In 10th European Test Symposium (ETS 2005), May 22-25, 2005, Tallinn, Estonia. pages 128-133, IEEE, 2005. [doi]

@inproceedings{CollinsAR05,
  title = {A programmable time measurement architecture for embedded memory characterization},
  author = {Matthew Collins and Bashir M. Al-Hashimi and Neil Ross},
  year = {2005},
  doi = {10.1109/ETS.2005.3},
  url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2005.3},
  researchr = {https://researchr.org/publication/CollinsAR05},
  cites = {0},
  citedby = {0},
  pages = {128-133},
  booktitle = {10th European Test Symposium (ETS 2005), May 22-25, 2005, Tallinn, Estonia},
  publisher = {IEEE},
  isbn = {0-7695-2341-2},
}