Bob Cometta, Jan Witte. Low Current and Low Voltages-The High-End OP AMP Testing Challenge. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 796-801, IEEE Computer Society, 1997.
@inproceedings{ComettaW97,
title = {Low Current and Low Voltages-The High-End OP AMP Testing Challenge},
author = {Bob Cometta and Jan Witte},
year = {1997},
tags = {testing},
researchr = {https://researchr.org/publication/ComettaW97},
cites = {0},
citedby = {0},
pages = {796-801},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}