Low Current and Low Voltages-The High-End OP AMP Testing Challenge - researchr publication

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Bob Cometta, Jan Witte. Low Current and Low Voltages-The High-End OP AMP Testing Challenge. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 796-801, IEEE Computer Society, 1997.

Abstract is missing.

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