Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Edward Javier Patiño Nuñez, Robert Limas Sierra, Matteo Sonza Reorda. Evaluating the Prevalence of SFUs in the Reliability of GPUs. In IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.