Jason Cong, John Lee, Lieven Vandenberghe. Robust gate sizing via mean excess delay minimization. In David Z. Pan, Gi-Joon Nam, editors, Proceedings of the 2008 International Symposium on Physical Design, ISPD 2008, Portland, Oregon, USA, April 13-16, 2008. pages 10-14, ACM, 2008. [doi]
Abstract is missing.