Zoe Conroy, James J. Grealish, Harrison Miles, Anthony J. Suto, Alfred L. Crouch, Skip Meyers. Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-10, IEEE Computer Society, 2012. [doi]
Abstract is missing.