Cristian Constantinescu, Srini Krishnamoorthy, Tuyen Nguyen. Estimating the effect of single-event upsets on microprocessors. In 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014. pages 185-190, IEEE, 2014. [doi]
Abstract is missing.