Using introspective software-based testing for post-silicon debug and repair - researchr publication authors

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Kypros Constantinides, Todd M. Austin. Using introspective software-based testing for post-silicon debug and repair. In Sachin S. Sapatnekar, editor, Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010. pages 537-542, ACM, 2010. [doi]

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