Massimo Conti, Paolo Crippa, Simone Orcioni, Claudio Turchetti. Statistical modeling of MOS transistor mismatch based on the parameters autocorrelation function. In International Symposium on Circuits and Systems (ISCAS 1999), May 30 - June 2, 1999, Orlando, Florida, USA. pages 222-225, IEEE, 1999. [doi]
Abstract is missing.