Gustavo K. Contreras, Nisar Ahmed, LeRoy Winemberg, Mark Mohammad Tehranipoor. Predictive LBIST model and partial ATPG for seed extraction. In 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015, Amherst, MA, USA, October 12-14, 2015. pages 139-146, IEEE, 2015. [doi]
Abstract is missing.