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Fast Electromigration Stress Evolution Analysis for Interconnect Trees Using Krylov Subspace Method

Chase Cook, Zeyu Sun, Ertugrul Demircan, Mehul D. Shroff, Sheldon X.-D. Tan. Fast Electromigration Stress Evolution Analysis for Interconnect Trees Using Krylov Subspace Method. IEEE Trans. VLSI Syst., 26(5):969-980, 2018. [doi]

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Chase Cook

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Zeyu Sun

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Ertugrul Demircan

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Mehul D. Shroff

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Sheldon X.-D. Tan

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