Chase Cook, Zeyu Sun, Ertugrul Demircan, Mehul D. Shroff, Sheldon X.-D. Tan. Fast Electromigration Stress Evolution Analysis for Interconnect Trees Using Krylov Subspace Method. IEEE Trans. VLSI Syst., 26(5):969-980, 2018. [doi]
No references recorded for this publication.
No citations of this publication recorded.