Reliability based hardware Trojan design using physics-based electromigration models

Chase Cook, Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan. Reliability based hardware Trojan design using physics-based electromigration models. Integration, 66:9-15, 2019. [doi]

Authors

Chase Cook

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Sheriff Sadiqbatcha

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Zeyu Sun

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Sheldon X.-D. Tan

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