Reliability based hardware Trojan design using physics-based electromigration models

Chase Cook, Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan. Reliability based hardware Trojan design using physics-based electromigration models. Integration, 66:9-15, 2019. [doi]

@article{CookSST19,
  title = {Reliability based hardware Trojan design using physics-based electromigration models},
  author = {Chase Cook and Sheriff Sadiqbatcha and Zeyu Sun and Sheldon X.-D. Tan},
  year = {2019},
  doi = {10.1016/j.vlsi.2019.01.011},
  url = {https://doi.org/10.1016/j.vlsi.2019.01.011},
  researchr = {https://researchr.org/publication/CookSST19},
  cites = {0},
  citedby = {0},
  journal = {Integration},
  volume = {66},
  pages = {9-15},
}