A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision

Tino Copani, Bert Vermeire, Anuj Jain, Habib Karaki, Kailash Chandrashekar, Sushmit Goswami, Jennifer Kitchen, Hoon Hee Chung, Ilker Deligoz, Bertan Bakkaloglu, Hugh J. Barnaby, Sayfe Kiaei. A fully integrated pulsed-LASER time-of-flight measurement system with 12ps single-shot precision. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 359-362, IEEE, 2008. [doi]

Abstract

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