Thiago Santos Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Leticia Maria Bolzani Poehls. Analyzing the behavior of FinFET SRAMs with resistive defects. In 2017 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2017, Abu Dhabi, United Arab Emirates, October 23-25, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.