Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects - researchr publication

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Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen. Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. J. Electronic Testing, 37(3):383-394, 2021. [doi]

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