Kai Cordes, Oliver Müller, Bodo Rosenhahn, Jörn Ostermann. HALF-SIFT: High-Accurate Localized Features for SIFT. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2009, Miami, FL, 20-25 June, 2009. pages 31-38, IEEE, 2009. [doi]
Abstract is missing.