Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda, Giovanni Squillero. Fully Automatic Test Program Generation for Microprocessor Cores. In 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany. pages 11006-11011, IEEE Computer Society, 2003. [doi]
@inproceedings{CornoCRS03,
title = {Fully Automatic Test Program Generation for Microprocessor Cores},
author = {Fulvio Corno and Gianluca Cumani and Matteo Sonza Reorda and Giovanni Squillero},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/date/2003/1870/01/187011006abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/CornoCRS03},
cites = {0},
citedby = {0},
pages = {11006-11011},
booktitle = {2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany},
publisher = {IEEE Computer Society},
isbn = {0-7695-1870-2},
}