Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda, Giovanni Squillero. Fully Automatic Test Program Generation for Microprocessor Cores. In 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany. pages 11006-11011, IEEE Computer Society, 2003. [doi]
No references recorded for this publication.
No citations of this publication recorded.