Fulvio Corno, Nicola Gaudenzi, Paolo Prinetto, Matteo Sonza Reorda. On the Identification of Optimal Cellular Automata for Built-In Self-Test of Sequential Circuits. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 424-429, IEEE Computer Society, 1998. [doi]
Abstract is missing.