Making the Circular Self-Test Path Technique Effective for Real Circuits - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda. Making the Circular Self-Test Path Technique Effective for Real Circuits. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 949-957, IEEE Computer Society, 1994.

This author has not been identified. Look up 'Fulvio Corno' in GoogleThis author has not been identified. Look up 'Paolo Prinetto' in GoogleThis author has not been identified. Look up 'Matteo Sonza Reorda' in Google

runs on WebDSL