Making the Circular Self-Test Path Technique Effective for Real Circuits - researchr publication bibliographies

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Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda. Making the Circular Self-Test Path Technique Effective for Real Circuits. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 949-957, IEEE Computer Society, 1994.

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